USB Port Charging Aging Test Cabinet (528 test stations)

The USB Port Charging Aging Test Cabinet (JY-LH528) is designed for high-efficiency reliability aging tests of USB sockets, connectors, and fast-charging interfaces. It provides 528 independent test stations to support comprehensive testing for high-volume production lines.

The USB Port Charging Aging Test Cabinet (JY-LH528) is designed for high-efficiency, reliable aging testing of USB sockets, connectors, and fast-charging interfaces. Built to comply with stringent industrial standards, the cabinet provides 528 independent test stations, delivering comprehensive testing capacity for high-volume production lines.

Each station operates independently and is equipped with precision over-voltage and over-current protection to maintain testing integrity. The system supports automatic timed aging, with configurable voltage and current settings to suit a range of testing requirements. Constructed with high-quality metal sheeting and finished in a durable porcelain-white baked coating, the cabinet is designed for long service life and a professional appearance in both laboratory and factory environments.